Inel offers a large variety of acquisition programs, for standard as well as for custom hardware configurations. All programs run under Windows®. The list includes the programs for powder and high resolution diffractometers, data acquisition of stress (plane and triaxial), retained austenite and textures (Equal area scan, Hexagonal Scan).The programs can control scintillating counters, proportional detectors, position sensitive detectors, up to 16 motions, high and Low-Temperature chambers, X-ray generator and other devices.
Data Collection : real time display of data collection (PSD or scanning mode), data overlay, can be done as background process, batch mode data collection. Printouts and data savings/export available during data collection. Real time 3D display available in case of data overlay and/or batch acquisition. Dead time correction for PSD acquisition. User friendly Batch experiment editor. Data Processing : background subtraction, smoothing, kalpha2 stripping, Peak search, Peak fitting (fully automatic, or semi-manual) : several envelopes available, data correction (eccentricity, offset, absorption), data linearization, data conversion (ASCII, GSAS, JADE, …), data overlay, standard overlay, user database overlay, calculated pattern overlay, crystallite size. PSD Calibration tool. Display : 2D interactive full color display (up to 4 axes, change color, limits, units, labeling…). 3D display in case of batch experiment (dynamic studies, reflectometry, Texture recordings) or data overlay, ODF 2D and 3D plots, graphic output as bitmap or PDF files, data export as XML, XLS, Text files.
Match! is an easy-to-use software for phase identification from powder diffraction data, which has become a daily task in material scientist’s work. Match! compares the powder diffraction pattern of your sample to a database containing reference patterns in order to identify the phases which are present. Single as well as multiple phases can be identified based on both peak data and raw (profile) data. As reference database, you can apply the included free-of-charge COD database and/or ICSD/Retrieve (if you have a valid license), use any ICDD PDF product, and/or create a user database based on your own diffraction patterns. The user database patterns can be edited manually, imported from peak files, calculated from crystal structure data (e.g. CIF files), or imported from your colleague's user database.